The Agilent 35670A is a Dynamic Signal Analyser designed to measure electromagnetic disturbance with the availability of ultrafast FFT time domain scans. The Agilent 35670A features real-time analysis with a wide range of diagnostic tools for detailed analysis of disturbance signals.

Where would this be used? The Agilent 35670A can be used for Radiated and Conducted Emissions analysis. It is also an extremely handy tool for signal analysis and can be used in conjunction with near field sniffer probes, current probes, voltage probes, and more for investigatory work.